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Index by Author: Aug 1998; 12 (15) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

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A

Aida, Noriko [Abstract] [Full Text]

Alt, Fred W. [Abstract] [Full Text]

Andino, Raul [Abstract] [Full Text]

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B

Bolhuis, Albert [Abstract] [Full Text]

Broekhuizen, Cees P. [Abstract] [Full Text]

Bron, Sierd [Abstract] [Full Text]

Buckmaster, Carolan [Abstract] [Full Text]

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C

Chen, Tung-Ti [Abstract] [Full Text]

Chiba, Tomoki [Abstract] [Full Text]

Cleveland, John L. [Abstract] [Full Text]

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D

Davidson, Laurie [Abstract] [Full Text]

de Stanchina, Elisa [Abstract] [Full Text]

Döderlein, Gabriele [Abstract] [Full Text]

Downes, Michael [Abstract] [Full Text]

Dyson, Nicholas [Full Text]

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E

Eischen, Christine M. [Abstract] [Full Text]

Evans, Ronald M. [Abstract] [Full Text]

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F

Feramisco, James R. [Abstract] [Full Text]

Ferbeyre, Gerardo [Abstract] [Full Text]

Ferguson, Edwin L. [Abstract] [Full Text]

Ferrier, Pierre [Abstract] [Full Text]

Frasch, Manfred [Abstract] [Full Text]

Fujiwara, Yuko [Abstract] [Full Text]

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G

Gamarnik, Andrea V. [Abstract] [Full Text]

Gilliland, D. Gary [Abstract] [Full Text]

Golub, Todd R. [Abstract] [Full Text]

Graf, Thomas [Abstract] [Full Text]

Graf, Thomas [Abstract] [Full Text]

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H

Hempel, William M. [Abstract] [Full Text]

Hibi, Masahiko [Abstract] [Full Text]

Hirano, Toshio [Abstract] [Full Text]

Huang, Fang [Abstract] [Full Text]

Hudson, John B. [Abstract] [Full Text]

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K

Kadesch, Tom [Abstract] [Full Text]

Kamijo, Takehiko [Abstract] [Full Text]

Kao, Hung-Ying [Abstract] [Full Text]

Kato, Seishi [Abstract] [Full Text]

Kawasaki, Hiroshi [Abstract] [Full Text]

Kawashima, Seiichi [Abstract] [Full Text]

Kim, Cheol-Hee [Abstract] [Full Text]

Kim, Gyung-Tae [Abstract] [Full Text]

Kintner, Chris R. [Abstract] [Full Text]

Kishi, Masashi [Abstract] [Full Text]

Knudsen, Erik S. [Abstract] [Full Text]

Kowenz-Leutz, Elisabeth [Abstract] [Full Text]

Koyano-Nakagawa, Naoko [Abstract] [Full Text]

Kuo, Frank [Abstract] [Full Text]

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L

Lowe, Scott W. [Abstract] [Full Text]

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M

Mathieu, Noëlle [Abstract] [Full Text]

McCurrach, Mila E. [Abstract] [Full Text]

McNagny, Kelly M. [Abstract] [Full Text]

Mizuno, Toshiro [Abstract] [Full Text]

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N

Nerlov, Claus [Abstract] [Full Text]

Nerlov, Claus [Abstract] [Full Text]

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O

Ordentlich, Peter [Abstract] [Full Text]

Orkin, Stuart H. [Abstract] [Full Text]

Osaka, Fumio [Abstract] [Full Text]

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P

Partanen, Juha [Abstract] [Full Text]

Prives, Carol [Abstract] [Full Text]

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Q

Quax, Wim J. [Abstract] [Full Text]

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R

Randle, David H. [Abstract] [Full Text]

Rossant, Janet [Abstract] [Full Text]

Roussel, Martine F. [Abstract] [Full Text]

Roussel, Martine F. [Abstract] [Full Text]

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S

Saeki, Mihoro [Abstract] [Full Text]

Samuelson, Andrew V. [Abstract] [Full Text]

Sasai, Yoshiki [Abstract] [Full Text]

Schlissel, Mark S. [Abstract] [Full Text]

Schumann, Wolfgang [Abstract] [Full Text]

Schwartz, Lois [Abstract] [Full Text]

Sherr, Charles J. [Abstract] [Full Text]

Sherr, Charles J. [Abstract] [Full Text]

Shieh, Sheau-Yann [Abstract] [Full Text]

Skolnik, Edward Y. [Abstract] [Full Text]

Stanhope-Baker, Patricia [Abstract] [Full Text]

Su, Yi-Chi [Abstract] [Full Text]

Swat, Wojciech [Abstract] [Full Text]

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T

Takeda, Hiroyuki [Abstract] [Full Text]

Tanaka, Keiji [Abstract] [Full Text]

Tang, Zhenyu [Abstract] [Full Text]

Tjalsma, Harold [Abstract] [Full Text]

Treisman, Jessica E. [Abstract] [Full Text]

Tsukaya, Hirokazu [Abstract] [Full Text]

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U

Uchimiya, Hirofumi [Abstract] [Full Text]

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V

van Dijl, Jan Maarten [Abstract] [Full Text]

van Roosmalen, Maarten L. [Abstract] [Full Text]

Venema, Gerard [Abstract] [Full Text]

Visvader, Jane [Abstract] [Full Text]

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W

Wang, Jean Y.J. [Abstract] [Full Text]

Wang, Li Chun [Abstract] [Full Text]

Wiegert, Thomas [Abstract] [Full Text]

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X

Xu, Xiaolei [Abstract] [Full Text]

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Y

Yamanaka, Yojiro [Abstract] [Full Text]

Yin, Zhizhang [Abstract] [Full Text]

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Z

Zindy, Frederique [Abstract] [Full Text]

Zindy, Frederique [Abstract] [Full Text]